The University of Southampton

Publications

Tenentes, Vasileios, Khursheed, Syed Saqib, Al-Hashimi, Bashir M., Zhong, Shida and Yang, Sheng (2014) High quality testing of grid style power gating At 23rd Asian Test Symposium (ATS), China. 16 - 19 Nov 2014. 6 pp, pp. 1-6.

Rossi, Daniele, Tenentes, Vasileios, Khursheed, Saqib and Al-Hashimi, Bashir (2015) NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating At IEEE European Test Symposium 2015, Romania. 25 - 29 May 2015.

Rossi, Daniele, Tenentes, Vasileios, Khursheed, Saqib and Al-Hashimi, Bashir M. (2015) BTI and leakage aware dynamic voltage scaling for reliable low power cache memories At 21st IEEE International On-Line Testing Symposium, Greece. 06 - 08 Jul 2015. 6 pp.

Tenentes, Vasileios, Rossi, Daniele, Khursheed, Saqib and Al-Hashimi, Bashir M. (2015) Diagnosis of power switches with power-distribution-network consideration At 20th IEEE European Test Symposium (ETS 2015), Romania. 25 - 29 May 2015. 6 pp.

Tenentes, Vasileios, Kavousianos, X. and Kalligeros, E. (2008) State skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores At Design, Automation and Test in Europe (DATE '08), Germany. 10 - 14 Mar 2008. 6 pp. (doi:10.1109/DATE.2008.4484726).

Balatsouka, S., Tenentes, Vasileios, Kavousianos, X. and Chakrabarty, K. (2010) Defect aware X-filling for low-power scan testing At Design, Automation & Test in Europe Conference & Exhibition (DATE), 2010, Germany. 08 - 12 Mar 2010. 6 pp. (doi:10.1109/DATE.2010.5456928).

Tenentes, Vasileios and Kavousianos, X. (2011) Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs At IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2011, United States. 07 - 10 Nov 2011. , pp. 747-754. (doi:10.1109/ICCAD.2011.6105413).

Tenentes, Vasileios, Kavousianos, X. and Kalligeros, E. (2010) Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 29, (10), pp. 1640-1644. (doi:10.1109/TCAD.2010.2051096).

Kavousianos, X., Tenentes, V., Chakrabarty, K. and Kalligeros, E. (2011) Defect-oriented LFSR reseeding to target unmodeled defects using stuck-at test sets IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 19, (12), pp. 2330-2335. (doi:10.1109/TVLSI.2010.2079961).

Tenentes, V. and Kavousianos, X. (2013) High-quality statistical test compression with narrow ATE interface IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 32, (9), pp. 1369-1382. (doi:10.1109/TCAD.2013.2256394).

Tenentes, Vasileios and Kavousianos, Xrysovalantis (2011) Low power test-compression for high test-quality and low test-data volume At 20th Asian Test Symposium (ATS), India. 20 - 23 Nov 2011. 6 pp, pp. 46-53. (doi:10.1109/ATS.2011.75).

Kavousianos, Xrysovalantis, Chakrabarty, Krishnendu, Kalligeros, Emmanouil and Tenentes, Vasileios (2010) Defect coverage-driven window-based test compression At 19th Asian Test Symposium (ATS), China. 01 - 04 Dec 2010. 6 pp, pp. 141-146. (doi:10.1109/ATS.2010.33).

Tenentes, Vasileios, Khursheed, Saqib, Rossi, Daniele, Yang, Sheng and Al-Hashimi, Bashir M. (2015) DFT architecture with power-distribution-network consideration for delay-based power gating test IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, pp. 1-12.

Rossi, Daniele, Tenentes, Vasileios, Yang, Sheng, Khursheed, Saqib and Al-Hashimi, Bashir (2015) Reliable power gating with NBTI aging benefits IEEE Transactions on Very Large Scale Integration (VLSI) Systems, pp. 1-10.

Rossi, Daniele, Tenentes, Vasileios, Yang, Sheng, Khursheed, Saqib and Al-Hashimi, Bashir (2016) Aging benefits in nanometer CMOS designs IEEE Transactions on Circuits and Systems. Part 2: Express Briefs, pp. 1-5.

Gutierrez Alcala, Mauricio Daniel, Tenentes, Vasileios and Kazmierski, Tomasz (2016) Susceptible workload driven selective fault tolerance using a probabilistic fault model At IOLTS'16, Spain. 04 - 06 Jul 2016. 6 pp.

Chahal, Hardeep, Tenentes, Vasileios, Rossi, Daniele and Al-Hashimi, Bashir M. (2016) BTI aware thermal management for reliable DVFS designs At Defect and Fault Tolerance in VLSI and Nanotechnology Systems Symposium (DFT'16), United States. 19 - 20 Sep 2016. 6 pp.

Tenentes, Vasileios, Rossi, Daniele, Yang, Sheng, Khursheed, Saqib, Al-Hashimi, Bashir M. and Gunn, Steve R. (2016) Coarse-grained online monitoring of BTI aging by reusing power gating infrastructure IEEE Transactions on Very Large Scale Integration (VLSI) Systems, pp. 1-12.

Tenentes, Vasileios, Rossi, Daniele, Yang, S, Khursheed, Saqib, Al-Hashimi, Bashir and Gunn, Stephen (2016) Data-set supporting the article entitled "Coarse-grained Online Monitoring of BTI Aging by Reusing Power Gating Infrastructure" University of Southampton [Dataset]

Halak, Basel, Tenentes, Vasileios and Rossi, Daniele (2016) The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology Microelectronics Reliability, 67, pp. 74-81. (doi:10.1016/j.microrel.2016.10.018).

Halak, Basel, Tenentes, Vasileios and Rossi, Daniele (2016) Data-set supporting the article entitled "The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology" University of Southampton doi:10.5258/SOTON/403411 [Dataset]

Gutierrez Alcala, Mauricio, D., Tenentes, Vasileios, Kazmierski, Tomasz J. and Rossi, Daniele (2017) Low power probabilistic online monitoring of systematic erroneous behaviour In 2017 22d IEEE Test Symposium (ETS). IEEE. 2 pp. (doi:10.1109/ETS.2017.7968239).

Bantock, James, Robert Benjamin, Tenentes, Vasileios, Al-Hashimi, Bashir and Merrett, Geoffrey (2017) Online tuning of Dynamic Power Management for efficient execution of interactive workloads In IEEE/ACM International Symposium on Low Power Electronics and Design. IEEE. 6 pp.

Bantock, James, Robert Benjamin, Tenentes, Vasileios, Al-Hashimi, Bashir and Merrett, Geoffrey (2017) Dataset for Online Tuning of Dynamic Power Management for Efficient Execution of Interactive Workloads University of Southampton [Dataset]

Gutierrez Alcala, Mauricio, Daniel, Tenentes, Vasileios, Rossi, Daniele and Kazmierski, Tomasz (2017) Susceptible workload evaluation and protection using selective fault tolerance Journal of Electronic Testing

Tenentes, Vasileios, Rossi, Daniele, Khursheed, Saqib, Al-Hashimi, Bashir and Chakrabarty, Krishnendu (2017) Dataset for: Leakage Current Analysis for Diagnosis of Bridge Defects in Power-Gating Designs University of Southampton doi:10.5258/SOTON/D0189 [Dataset]

Rossi, Daniele, Tenentes, Vasileios, Reddy, Sudhakar, Al-Hashimi, Bashir and Brown, Andrew (2017) Exploiting aging benefits for the design of reliable drowsy cache memories IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (doi:10.1109/TCAD.2017.2729399).

Tenentes, Vasileios, Rossi, Daniele, Khursheed, Saqib, Al-Hashimi, Bashir and Chakrabarty, Krishnendu (2017) Leakage current analysis for diagnosis of bridge defects in power-gating designs IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (doi:10.1109/TCAD.2017.2729462).

Gutierrez Alcala, Mauricio, Daniel, Tenentes, Vasileios, Kazmierski, Tomasz and Rossi, Daniele (2017) Low cost error monitoring for improved maintainability of IoT applications At IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. 23 - 25 Oct 2017. 6 pp.

Tenentes, Vasileios, Leech, Charles, Bragg, Graeme, Merrett, Geoffrey, Al-Hashimi, Bashir, Amrouch, Hussam, Henkel, Jörg and Das, Shidhartha (2017) Hardware and software innovations in energy-efficient system-reliability monitoring In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IEEE. 5 pp.

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