The University of Southampton

Radi Bin Ramlee

Postgraduate research student


Bin Ramlee, Radi Husin and Zwolinski, Mark (2016) Using Iddt current degradation to monitor ageing in CMOS circuits At International Workshop on Power And Timing Modeling, Optimization and Simulation (PATMOS 2016), Germany. 21 - 23 Sep 2016. , pp. 200-204. (doi:10.1109/PATMOS.2016.7833688).


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