Bin Ramlee, Radi Husin and Zwolinski, Mark (2016) Using Iddt current degradation to monitor ageing in CMOS circuits. International Workshop on Power And Timing Modeling, Optimization and Simulation (PATMOS 2016), Germany. 21 - 23 Sep 2016. pp. 200-204 . (doi:10.1109/PATMOS.2016.7833688).
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Email: r.h.binramlee@soton.ac.uk