This research is concerned with the non-destructinve testing of cable insulation and associated semiconducting sheaths that insulate high voltage cables. The current inspection procedure for testing the cable insulation utilises conventional X-ray and photographic film technologies. With this system, it is possible to produce clear images of the cable insulation and identify defects as small as 50 �m, however process is labour intensive, time consuming, requires a dark room for processing, uses specialist knowledge, can be subject to interpretation and other human errors, produces significant chemical waste, and it is difficult to catalogue inspection results. For these reasons, there is a drive to convert the system into an automated digital system. It is hoped that as a result of this research such a system will be produced.